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    CVE-2024-53017

    Memory corruption while handling test pattern generator IOCTL command.

    Published:Jun 3, 2025
    Last Modified:Aug 20, 2025
    EPS:Jun 3, 2025
    EPSS Score:0.00019
    CVSS Score:6.6

    Affected Products

    Vendor
    Qualcomm
    Product
    Sdm429w
    Vendor
    Qualcomm
    Product
    Sdm429w Firmware
    Vendor
    Qualcomm
    Product
    Snapdragon 429 Mobile Platform
    Vendor
    Qualcomm
    Product
    Snapdragon 429 Mobile Platform Firmware
    Vendor
    Qualcomm
    Product
    Wcn3620
    Vendor
    Qualcomm
    Product
    Wcn3620 Firmware
    Vendor
    Qualcomm
    Product
    Wcn3660b
    Vendor
    Qualcomm
    Product
    Wcn3660b Firmware

    Exploits

    No exploit reference

    Common Attack Pattern Enumeration and Classification (CAPEC)

    Related CVEs

    Common Vulnerability Scoring System

    Attack Vector
    Network
    Adjacent
    Local
    Physical
    Privileges Required
    None
    Low
    High
    User Interaction
    None
    Required
    Scope
    Unchanged
    Changed
    Confidentiality
    None
    Low
    High
    Integrity
    None
    Low
    High
    Availability
    None
    Low
    High