CVE Feed

    Dashboard / CVE / CVE-2025-9709

    CVE-2025-9709

    On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.

    Published:Sep 5, 2025
    Last Modified:Apr 15, 2026
    EPS:Sep 5, 2025
    EPSS Score:0.00029
    CVSS Score:8.6

    Affected Products

    No affected product recorded yet

    Exploits

    No exploit reference

    Common Vulnerability Scoring System

    Attack Vector
    Network
    Adjacent
    Local
    Physical
    Privileges Required
    None
    Low
    High
    User Interaction
    None
    Required
    Scope
    Unchanged
    Changed
    Confidentiality
    None
    Low
    High
    Integrity
    None
    Low
    High
    Availability
    None
    Low
    High