OESA-2022-1607
Dashboard / Vulnerabilities / OESA-2022-1607
OESA-2022-1607
Summary: libtiff security update
Details: This provides support for the Tag Image File Format (TIFF), a widely used format for storing image data. The latest version of the TIFF specification is available on-line in several different formats.And contains command-line programs for manipulating TIFF format image files using the libtiff library. Security Fix(es): Null source pointer passed as an argument to memcpy() function within TIFFFetchNormalTag () in tif_dirread.c in libtiff versions up to 4.3.0 could lead to Denial of Service via crafted TIFF file.(CVE-2022-0908) Unchecked Return Value to NULL Pointer Dereference in tiffcrop in libtiff 4.3.0 allows attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit f2b656e2.(CVE-2022-0907) Reachable Assertion in tiffcp in libtiff 4.3.0 allows attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit 5e180045.(CVE-2022-0865) Divide By Zero error in tiffcrop in libtiff 4.3.0 allows attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit f8d0f9aa.(CVE-2022-0909) Out-of-bounds Read error in tiffcp in libtiff 4.3.0 allows attackers to cause a denial-of-service via a crafted tiff file. For users that compile libtiff from sources, the fix is available with commit 408976c4.(CVE-2022-0924)
References: https://www.openeuler.org/en/security/safety-bulletin/detail.html?id=openEuler-SA-2022-1607, https://nvd.nist.gov/vuln/detail/CVE-2022-0908, https://nvd.nist.gov/vuln/detail/CVE-2022-0907, https://nvd.nist.gov/vuln/detail/CVE-2022-0865, https://nvd.nist.gov/vuln/detail/CVE-2022-0909, https://nvd.nist.gov/vuln/detail/CVE-2022-0924
Affected packages
Package
Name: libtiff
Purl: pkg:rpm/openEuler/libtiff&distro=openEuler-20.03-LTS-SP1
Affected ranges
Type: ECOSYSTEM
Events:
